Hophil Min(Korea Institute of Science and Technology) ; Boyoung Han(Korea Institute of Science and Technology) ; Changmin Sung(Korea Institute of Science and Technology) ; Ju-Hyung Park(Korea Institute of Science and Technology) ; Kang Mi Lee(Korea Institute of Science and Technology) ; Ho Jun Kim(Korea Institute of Science and Technology) ; Ki Hun Kim(Korea Institute of Science and Technology) ; Junghyun Son(Korea Institute of Science and Technology) ; Oh-SeungKwon(Korea Institute of Science and Technology) ; Jaeick Lee(Korea Institute of Science and Technology)
(pp.55-63)https://doi.org/10.5478/MSL.2016.7.3.55
Yeonmi Seong(Sogang University) ; Sang Yun Han(Korea Research Institute of Standards and Science) ; Sung-Chan Jo(Samsung Electronics) ; Han Bin Oh(Sogang University)
(pp.73-75)https://doi.org/10.5478/MSL.2011.2.3.073