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Statistical Characterization of the Multi-Charged Fragment Ions in the CID and HCD Spectrum
Sangeetha Ramachandran(Department of Electronics, Cochin University of Science and Technology) ; Tessamma Thomas(Department of Electronics, Cochin University of Science and Technology) (pp.41-46) https://doi.org/10.5478/MSL.2021.12.2.41
Unusual Applications of Kendrick Plots: Recalibration and Tolerance
Thierry N. J. Fouquet(Surgical Analytical & Materials Science (SAMS)) ; Orlando Cabarcos(Surgical Analytical & Materials Science (SAMS)) (pp.173-177) https://doi.org/10.5478/MSL.2023.14.4.173
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